Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
EurekAlert!

Automated optical inspection of FAST’s reflector surface using drones and computer vision

The Five-hundred-meter Aperture Spherical radio Telescope (FAST), also known as the “China Sky Eye”, is the world's largest single-dish radio telescope. Its reflector is a partial sphere of radius ...
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Electronic Design

A Look Inside Automated X-Ray Inspection

AXI is an effective technology for finding manufacturing defects in electronics assembly operations. Manufacturers of advanced electronics products know that simultaneously producing a ...
EurekAlert!

Optical wafer defect inspection at the 10 nm technology node and beyond

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...