Scientists just measured the smallest possible contacts for future computer chips

The rise of AI has created an almost insatiable appetite for computing power. Training and running AI systems requires vast ...
IEEE

Thermal and Electrical Stress Differences of SiC MOSFET Under Active/Reactive Loads in AC Power Cycling Test

Abstract: Thermal and electrical stresses are key factors influencing the reliability of SiC MOSFETs. The alternating current (AC) power cycling test (PCT) has emerged as a more representative ...
techxplore

Ultra-thin MoS₂ computer packs 1,400 transistors onto one chip

The rapid advancement and diffusion of artificial intelligence (AI) systems, such as the machine learning models underpinning the functioning of ChatGPT, Gemini and similar platforms, have posed new ...
IEEE

Comprehensive Analysis on Complementary FET

Abstract: Complementary Field Effect Transistors (CFETs) have surfaced as a hopeful path to the continued logic area scaling in CMOS technology. This comprehensive review paper explores recent ...